Atomic Force Microscopy Physical Chemist Expert Witness

Technical Consultant #1259

Atomic force microscopy (AFM) of hundreds of different materials and devices
AFM expert witness and consultant
AFM measurements on optical disks: track pitch, jitter, wobble, grooves
AFM high precision calibration and measurements
AFM of paper, plastic, polymers, biomaterials, DNA, Collagen
AFM of pharmaceutical materials, active ingredients, inactive, excipients
AFM of metals, ceramics, glass, composite, magnetic and electronic materials
AFM microroughness, roughness of polished Silicon wafers (GMP), SiC, fused silica
Laser safety

Independent Consultant, 1990-present

Analytical and consulting laboratory work providing research, analytical services, consultation and training
Microscopy: Experienced research user of Atomic Force Microscope (AFM), Scanning Tunneling Microscope (STM), Scanning Electron Microscope (SEM), and various optical microscopes. Research: invention of high precision feature measurement system using AFM, development of materials analysis applications of AFM phase imaging, surface structure of thin films, polished surfaces, and polymer fibers; microanalysis of bulk defects in ceramics; and application of optical microscopy to process improvement.
Laser Spectroscopy and Optics: Experienced designer and research user of pulsed and continuous visible and ultraviolet lasers, monochromators and optical multichannel analyzers. Research: photochemistry of proteins, energy transfer in isolated molecules, and low temperature studies of ceramics.

Boehringer Mannheim Corp., Research and Development, 1988-1990

Project Engineer II: Supervision of a medical instrument assessment group and a production group, including capital expenditures and purchases of statistical software. Earned "Superior Product Development" award (1989) for improvements to a manufacturing process (raised yield from 20% to 70% while improving quality).

BP America (formerly Standard Oil (Ohio)) Corporate Research, 1980-1988

Selected publications, patent:

Automated, high precision measurement of critical dimensions using the Atomic Force Microscope, J. Vac. Sci. Technol
Atomic Force Microscopy, chapter 19 in Comprehensive Desk Reference of Polymer Characterization and Analysis, Oxford University Press
AFM Length Analysis of Data Marks: Measuring Jitter, Asymmetry, Process Noise and Process Position, Optical Data Storage 2001
Analysis of Composite Surfaces with the Atomic Force Microscope: A Problem-Solving Approach, Surface Modification Technologies XV
High precision calibration and feature measurement system for a scanning probe microscope
Professional organizations: American Physical Society; Sigma Xi; American Chemical Society; American Vacuum Society; Microscopy Society of America
Referee: Journal of Chemical Physics, Chemical Physics, Journal of the American Chemical Society, Journal of Physical Chemistry, Journal of Vacuum Science and Technology