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Atomic Force Microscopy Physical Chemist Expert Witness

Technical Consultant #1259


  • Atomic force microscopy (AFM) of hundreds of different materials and devices
  • AFM expert witness and consultant
  • AFM measurements on optical disks: track pitch, jitter, wobble, grooves
  • AFM high precision calibration and measurements
  • AFM of paper, plastic, polymers, biomaterials, DNA, Collagen
  • AFM of pharmaceutical materials, active ingredients, inactive, excipients
  • AFM of metals, ceramics, glass, composite, magnetic and electronic materials
  • AFM microroughness, roughness of polished Silicon wafers (GMP), SiC, fused silica
  • Laser safety


Independent Consultant, 1990-present

  • Analytical and consulting laboratory work providing research, analytical services, consultation and training
  • Microscopy: Experienced research user of Atomic Force Microscope (AFM), Scanning Tunneling Microscope (STM), Scanning Electron Microscope (SEM), and various optical microscopes. Research: invention of high precision feature measurement system using AFM, development of materials analysis applications of AFM phase imaging, surface structure of thin films, polished surfaces, and polymer fibers; microanalysis of bulk defects in ceramics; and application of optical microscopy to process improvement.
  • Laser Spectroscopy and Optics: Experienced designer and research user of pulsed and continuous visible and ultraviolet lasers, monochromators and optical multichannel analyzers. Research: photochemistry of proteins, energy transfer in isolated molecules, and low temperature studies of ceramics.

Boehringer Mannheim Corp., Research and Development, 1988-1990

  • Project Engineer II: Supervision of a medical instrument assessment group and a production group, including capital expenditures and purchases of statistical software. Earned "Superior Product Development" award (1989) for improvements to a manufacturing process (raised yield from 20% to 70% while improving quality).

BP America (formerly Standard Oil (Ohio)) Corporate Research, 1980-1988

  • Project Leader, Chemical Physics and Analytical Microscopy
  • Senior Research Chemist, Chemical Physics

Honors & Publications

Selected publications, patent:

  • Automated, high precision measurement of critical dimensions using the Atomic Force Microscope, J. Vac. Sci. Technol
  • Atomic Force Microscopy, chapter 19 in Comprehensive Desk Reference of Polymer Characterization and Analysis, Oxford University Press
  • AFM Length Analysis of Data Marks: Measuring Jitter, Asymmetry, Process Noise and Process Position, Optical Data Storage 2001
  • Analysis of Composite Surfaces with the Atomic Force Microscope: A Problem-Solving Approach, Surface Modification Technologies XV
  • High precision calibration and feature measurement system for a scanning probe microscope
  • Professional organizations: American Physical Society; Sigma Xi; American Chemical Society; American Vacuum Society; Microscopy Society of America
  • Referee: Journal of Chemical Physics, Chemical Physics, Journal of the American Chemical Society, Journal of Physical Chemistry, Journal of Vacuum Science and Technology


  • Ph.D., Physical Chemistry, University of Chicago
  • B.S., Chemistry, University of Chicago
  • National Science Foundation Graduate Fellowship
  • University of Chicago Harkins Fellowship in Physical Chemistry
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