Atomic Force Microscopy Physical Chemist Expert Witness

Technical Consultant #1259


  • Atomic force microscopy (AFM) of hundreds of different materials and devices
  • AFM expert witness and consultant
  • AFM measurements on optical disks: track pitch, jitter, wobble, grooves
  • AFM high precision calibration and measurements
  • AFM of paper, plastic, polymers, biomaterials, DNA, Collagen
  • AFM of pharmaceutical materials, active ingredients, inactive, excipients
  • AFM of metals, ceramics, glass, composite, magnetic and electronic materials
  • AFM microroughness, roughness of polished Silicon wafers (GMP), SiC, fused silica
  • Laser safety


Independent Consultant, 1990-present

  • Analytical and consulting laboratory work providing research, analytical services, consultation and training
  • Microscopy: Experienced research user of Atomic Force Microscope (AFM), Scanning Tunneling Microscope (STM), Scanning Electron Microscope (SEM), and various optical microscopes. Research: invention of high precision feature measurement system using AFM, development of materials analysis applications of AFM phase imaging, surface structure of thin films, polished surfaces, and polymer fibers; microanalysis of bulk defects in ceramics; and application of optical microscopy to process improvement.
  • Laser Spectroscopy and Optics: Experienced designer and research user of pulsed and continuous visible and ultraviolet lasers, monochromators and optical multichannel analyzers. Research: photochemistry of proteins, energy transfer in isolated molecules, and low temperature studies of ceramics.

Boehringer Mannheim Corp., Research and Development, 1988-1990

  • Project Engineer II: Supervision of a medical instrument assessment group and a production group, including capital expenditures and purchases of statistical software. Earned "Superior Product Development" award (1989) for improvements to a manufacturing process (raised yield from 20% to 70% while improving quality).

BP America (formerly Standard Oil (Ohio)) Corporate Research, 1980-1988

  • Project Leader, Chemical Physics and Analytical Microscopy
  • Senior Research Chemist, Chemical Physics

Honors & Publications

Selected publications, patent:

  • Automated, high precision measurement of critical dimensions using the Atomic Force Microscope, J. Vac. Sci. Technol
  • Atomic Force Microscopy, chapter 19 in Comprehensive Desk Reference of Polymer Characterization and Analysis, Oxford University Press
  • AFM Length Analysis of Data Marks: Measuring Jitter, Asymmetry, Process Noise and Process Position, Optical Data Storage 2001
  • Analysis of Composite Surfaces with the Atomic Force Microscope: A Problem-Solving Approach, Surface Modification Technologies XV
  • High precision calibration and feature measurement system for a scanning probe microscope
  • Professional organizations: American Physical Society; Sigma Xi; American Chemical Society; American Vacuum Society; Microscopy Society of America
  • Referee: Journal of Chemical Physics, Chemical Physics, Journal of the American Chemical Society, Journal of Physical Chemistry, Journal of Vacuum Science and Technology


  • Ph.D., Physical Chemistry, University of Chicago
  • B.S., Chemistry, University of Chicago
  • National Science Foundation Graduate Fellowship
  • University of Chicago Harkins Fellowship in Physical Chemistry
Save Resume #1259
to Contact Form?

You must first click "Yes" to save this resume

Submit Request

You have no Saved Resumes

Add resumes within our various Ares of Expertise by clicking "Add Resume(s)" below.

Add Resume(s)